Jeol JSM-6460 with O

Listing description

JEOL JSM 6460 Scanning Electron Microscope (SEM) with Oxford INCA Energy EDS system and MICS Microscope Image Capture System is a high-performance versatile SEM. The high-precision electron optical system incorporated in this SEM is effectively used with the large flexible specimen chamber that accommodates a 200mm diameter specimen. The easy-to-understand, easy-to-use operation GUI is developed for multi-user environment.
Magnification and Resolution photos will be provided. The system is 4 years old and was always under service contract until it was professional decommissioned by JEOL.

Magnification (X): 5 to 300000
Resolution (nm): 3.00
Accelerating Voltage (kilovolts): 0 to 30
Digital Display
Computer Interface
Optimized for fitting and integrating X-ray spectrometers

This equipment is located in US