Keithley 4200

Listing description

Keithley 4200-SCS with four medium power SMUs 4200-MPSMU and one capacitance measurement unit 4210-CVU. Virtually new, no wares or tear on unit, in perfect working condition. It has been purchased for a project which was canceled and since then it has been mostly sitting in the original box.

The 4200-SCS is a modular, fully integrated parameter analyzer that performs electrical characterization of materials, semiconductor devices and processes. From basic I-V and C-V measurement sweeps to advanced ultra-fast pulsed I-V, waveform capture, and transient I-V measurements, the 4200-SCS provides the researcher or engineer with critical parameters needed for design, development or production.

The Most Comprehensive Solution For Semiconductor Device Characterization

Materials and device research
Device and process development
Device modeling
Reliability and lifetime testing
Failure analysis
For CMOS semiconductor technology and more
High power MOSFET, BJT, and III-V device characterization
Nanotechnology and MEMs research
Advanced NVM testing
Organic electronics characterization
Solar cell/photovoltaic device characterization

This equipment is located in US