KLA TENCOR CANDELA CS2

Listing description

MANUFACTURER: KLA TENCOR
MODEL: CANDELA CS2
The Candela CS2 wafer defect detection system simultaneously measures surface reflectivity and topography for automatic defect detection and classification. The automated wafer inspection system's defect detection and inspection technology combines scatterometry, ellipsometry, reflectometry, and topographical analysis to non-destructively inspect wafer surfaces for defects, and film thickness uniformity, of opaque substrates, epi layers, and transparent film coatings

This equipment is located in US