Description
The Titan™ G2 80-200 is a high-performance transmission electron microscope (TEM) with scanning capabilities (STEM), designed for atomic resolution imaging and chemical identification. It operates at acceleration voltages between 80-200 kV and features a field-emitting electron cannon (FEG). As part of the Titan G2 family, it delivers exceptional performance across all modes: TEM, STEM, EFTEM, and EELS, with resolutions of 0.09 nm in TEM mode and 0.08 nm in STEM mode.
Equipped with ChemiSTEM™ Technology, it offers advanced analytical capabilities, including an X-FEG high-brightness gun and DCOR Cs-probe corrector, achieving optical resolutions of 80 pm in STEM and 90 pm in TEM. The ChemiSTEM™ system, featuring a Super-X 4-SDD, windowless EDX detector, and fast mapping electronics, enables rapid elemental mapping with 100,000 spectra per second. It enhances EDX mapping speed and sensitivity by 50-100 times compared to conventional systems and supports EDX tomography for 3D elemental mapping.
The microscope’s design includes a three-lens condenser system, modular column for stability, and a ConstantPower™ lens system for thermal consistency. The wide pole piece gap accommodates special holders and high tilt angles for advanced analysis. A computerized 5-axis specimen stage ensures precise positioning and minimal drift for high-resolution studies.
Key benefits include ultra-sensitive atomic-level mapping, high-resolution imaging, and a stable electron source. The system is versatile, with an oil-free vacuum, large liquid nitrogen dewar, and comprehensive EDX microanalysis suite. Installation requires a stable environment, specific power and cooling needs, and provisions for gas and vacuum supplies, ensuring optimal performance for advanced research in materials science and nanotechnology.
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