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Hologenix NGS 3500 P240314086
Hologenix NGS 3500 P240314086
Hologenix NGS 3500 P240314086
Hologenix NGS 3500 P240314086

Hologenix NGS 3500 Defect Detection System Verified seller

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Manufacturer Hologenix
Model NGS 3500
Year
Location USA US
Category Inspection equipment
Product id P240314086
Language
bg Профилен проектор Hologenix NGS 3500
cs Projektor na kontrolu profilu Hologenix NGS 3500
da Hologenix NGS 3500 Profilprojektor
de Hologenix NGS 3500 Profilprojektor
el Προβολέας προφίλ Hologenix NGS 3500
en Hologenix NGS 3500 Defect Detection System
es Proyector de perfil Hologenix NGS 3500
fr Projecteur de profil Hologenix NGS 3500
hr Projektor profila Hologenix NGS 3500
hu Hologenix NGS 3500 Profil projektor
it Proiettor profili Hologenix NGS 3500
lt Profilinis projektorius Hologenix NGS 3500
nl Hologenix NGS 3500 Profielprojector
pl Profile projector Hologenix NGS 3500
pt Projetor de perfil Hologenix NGS 3500
ro Proiector de profil Hologenix NGS 3500
ru Hologenix NGS 3500 Проектор профил
sr Profil projektor Hologenix NGS 3500
sv Hologenix NGS 3500 Profilprojektor
tr Profil projektörü Hologenix NGS 3500

Specifications

-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status

Description

Automatic Defect Detection & Classification
Automated Die Inspection
Precision Dimensional Metrology
Critical Dimension (CD) and Overlay Metrology
Automatic and Manual Operation
Surface & Edge Defect Detection
Texture Defect Detection (e.g. stains, etc.)
Missing or Deformed Object Detection
Extensive Defect Review Capability
Graphic Maps & Image Archival
CAD file import
The NGS Series defect detection and metrology systems are designed for applications where automated optical defect detection and precision dimensional measurements on wafers and other parts are required. They are well suited for dual use as production tools or as versatile process development systems. These systems offer a choice of high end microscope components (Olympus/Nikon/Leica), BF/ DF/ DIC illumination, and linear motor staging with 0.02 micron scales. There are several configurations available depending on your requirements. These include:a 200mm platform, a 300mm platform and a robotic platform for automated wafer and part handling.

Advanced wafer level dimensional metrology and defect detection system
motorized stage with 8"x8" XY travel
motorized focus
brightfield and darkfield inspection
5-100 defects/measurements per second typical
200mm/s staging speed
software controlled coaxial and backlight (transmitted light) with dual 150w fiber optic power supplies
maximum stage load capacity 50lbs
granite base and Z column
closed loop linear stages and Z axis with position feedback and Micro-e Mercury 3500 smart encoder systems provide better then 1um resolution
Software: RMS Vision Systems with color graphics, image archiving, and offline review of defects
Nikon microscope with motorized objective rotation, tilting ultrawide trinocular viewing head with 10x eyepieces
Hitachi CCTV, Windows XP

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


Client type Reseller
Active since 2019
Offers online 73
Last activity Dec. 19, 2024

Description

Automatic Defect Detection & Classification
Automated Die Inspection
Precision Dimensional Metrology
Critical Dimension (CD) and Overlay Metrology
Automatic and Manual Operation
Surface & Edge Defect Detection
Texture Defect Detection (e.g. stains, etc.)
Missing or Deformed Object Detection
Extensive Defect Review Capability
Graphic Maps & Image Archival
CAD file import
The NGS Series defect detection and metrology systems are designed for applications where automated optical defect detection and precision dimensional measurements on wafers and other parts are required. They are well suited for dual use as production tools or as versatile process development systems. These systems offer a choice of high end microscope components (Olympus/Nikon/Leica), BF/ DF/ DIC illumination, and linear motor staging with 0.02 micron scales. There are several configurations available depending on your requirements. These include:a 200mm platform, a 300mm platform and a robotic platform for automated wafer and part handling.

Advanced wafer level dimensional metrology and defect detection system
motorized stage with 8"x8" XY travel
motorized focus
brightfield and darkfield inspection
5-100 defects/measurements per second typical
200mm/s staging speed
software controlled coaxial and backlight (transmitted light) with dual 150w fiber optic power supplies
maximum stage load capacity 50lbs
granite base and Z column
closed loop linear stages and Z axis with position feedback and Micro-e Mercury 3500 smart encoder systems provide better then 1um resolution
Software: RMS Vision Systems with color graphics, image archiving, and offline review of defects
Nikon microscope with motorized objective rotation, tilting ultrawide trinocular viewing head with 10x eyepieces
Hitachi CCTV, Windows XP

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase

Specifications

-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status

About this seller

Client type Reseller
Active since 2019
Offers online 73
Last activity Dec. 19, 2024

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Hologenix NGS 3500 Defect Detection System