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Metricon 2010/M P240314068
Metricon 2010/M P240314068
Metricon 2010/M P240314068
Metricon 2010/M P240314068

Metricon 2010/M Prism Coupler Verified seller

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Manufacturer Metricon
Model 2010/M
Year 2018
Location USA US
Category Semiconductor - Metrology equipment
Product id P240314068
Language
bg Профилен проектор Metricon 2010/M
cs Projektor na kontrolu profilu Metricon 2010/M
da Metricon 2010/M Profilprojektor
de Metricon 2010/M Profilprojektor
el Προβολέας προφίλ Metricon 2010/M
en Metricon 2010/M Prism Coupler
es Proyector de perfil Metricon 2010/M
fr Projecteur de profil Metricon 2010/M
hr Projektor profila Metricon 2010/M
hu Metricon 2010/M Profil projektor
it Proiettor profili Metricon 2010/M
lt Profilinis projektorius Metricon 2010/M
nl Metricon 2010/M Profielprojector
pl Profile projector Metricon 2010/M
pt Projetor de perfil Metricon 2010/M
ro Proiector de profil Metricon 2010/M
ru Metricon 2010/M Проектор профил
sr Profil projektor Metricon 2010/M
sv Metricon 2010/M Profilprojektor
tr Profil projektörü Metricon 2010/M

Specifications

Software
-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status

Description

Index Accuracy: ±.0005 (worst case). Absolute index accuracy is limited primarily by uncertainties in determining the angle and refractive index of the measuring prism. For samples of reasonable optical quality, if a high resolution table is used and if the user is willing to perform a simple calibration procedure with each prism, absolute index accuracy of ±.0001-.0002 can be achieved. NIST, fused silica, and other standards are available for index calibration.
Index resolution: ±.0003 (worst case). For samples of reasonable optical quality, index resolution can be improved up to ±.00005 by use of a high resolution rotary table, a no-cost option.
Thickness accuracy: ±(0.5% + 5 nm)
Thickness resolution: ±0.3%
Operating wavelength: Optional shorter wavelengths (405, 450, 473, 532, 594 nm) for measurement of thinner films and near-IR (830, 980, 1064, 1310, 1550 nm) wavelengths for fiber/integrated optics applications are available. Optional sources change CDRH safety class to IIIa or IIIb.
Typical measurement time: 10-25 seconds with standard table, 20-75 seconds with high resolution table.
Measurement area: While the film and measuring prism are in contact over an area roughly 8 mm square, film area actually measured is only 1 mm diameter.
Refractive index measuring range: With standard prisms, films and bulk materials with refractive index 2.65 and below are measurable. Specialized prisms are available to permit index measurements up to 3.35 (consult Metricon for details).
Film types/thickness ranges measurable: The Model 2010/M can measure virtually any film type which is not metallic or very highly absorbing at the operating wavelength. In many cases, thickness and index of one or both films of dual film layers are measurable*, provided the top film has higher refractive index. Thickness must exceed a minimum threshold which depends on film and substrate (or underlying film) index.

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


Client type Reseller
Active since 2019
Offers online 73
Last activity Dec. 19, 2024

Description

Index Accuracy: ±.0005 (worst case). Absolute index accuracy is limited primarily by uncertainties in determining the angle and refractive index of the measuring prism. For samples of reasonable optical quality, if a high resolution table is used and if the user is willing to perform a simple calibration procedure with each prism, absolute index accuracy of ±.0001-.0002 can be achieved. NIST, fused silica, and other standards are available for index calibration.
Index resolution: ±.0003 (worst case). For samples of reasonable optical quality, index resolution can be improved up to ±.00005 by use of a high resolution rotary table, a no-cost option.
Thickness accuracy: ±(0.5% + 5 nm)
Thickness resolution: ±0.3%
Operating wavelength: Optional shorter wavelengths (405, 450, 473, 532, 594 nm) for measurement of thinner films and near-IR (830, 980, 1064, 1310, 1550 nm) wavelengths for fiber/integrated optics applications are available. Optional sources change CDRH safety class to IIIa or IIIb.
Typical measurement time: 10-25 seconds with standard table, 20-75 seconds with high resolution table.
Measurement area: While the film and measuring prism are in contact over an area roughly 8 mm square, film area actually measured is only 1 mm diameter.
Refractive index measuring range: With standard prisms, films and bulk materials with refractive index 2.65 and below are measurable. Specialized prisms are available to permit index measurements up to 3.35 (consult Metricon for details).
Film types/thickness ranges measurable: The Model 2010/M can measure virtually any film type which is not metallic or very highly absorbing at the operating wavelength. In many cases, thickness and index of one or both films of dual film layers are measurable*, provided the top film has higher refractive index. Thickness must exceed a minimum threshold which depends on film and substrate (or underlying film) index.

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase

Specifications

Software
-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status

About this seller

Client type Reseller
Active since 2019
Offers online 73
Last activity Dec. 19, 2024

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Metricon 2010/M Prism Coupler