Nanometrics Nanospec AFT2100 Film Thickness Measurement System Verified seller

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Manufacturer Nanometrics
Model Nanospec AFT2100
Year
Location USA US
Category Semiconductor - Metrology equipment
Product id P240314063
Language

Specifications

Software
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Worked hours
Hours under power
State good
At local norms ---------
Status

Description

film thickness from 100A to 50 microns
Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator
spot size 6.5um to 65um
wavelength range 400-800nm
16 standard films tests
special films can be measured by entering the refractive index
Refurbished by Nanometrics factory trained technicians March 2022

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


Client type Reseller
Active since 2019
Offers online 73
Last activity Nov. 7, 2024

Description

film thickness from 100A to 50 microns
Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator
spot size 6.5um to 65um
wavelength range 400-800nm
16 standard films tests
special films can be measured by entering the refractive index
Refurbished by Nanometrics factory trained technicians March 2022

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


Specifications

Software
-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status

About this seller

Client type Reseller
Active since 2019
Offers online 73
Last activity Nov. 7, 2024

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Nanometrics Nanospec AFT2100 Film Thickness Measurement System