Categories
Start selling

Account

Log In
Create an account

Account

Log In
Create an account
Semilab CMS3 P240314066
Semilab CMS3 P240314066
Semilab CMS3 P240314066
Semilab CMS3 P240314066

Semilab CMS3 Sheet Resistance Measuring System Verified seller

Price on request

Make an offer
Manufacturer Semilab
Model CMS3
Year
Location USA US
Category Semiconductor - Metrology equipment
Product id P240314066
Language
bg Машина за вафли Semilab CMS3
cs Waferovací stroj Semilab CMS3
da Semilab CMS3 Wafer maskine
de Semilab CMS3 Waferanlage
el Μηχανή γκοφρέτας Semilab CMS3
en Semilab CMS3 Sheet Resistance Measuring System
es Máquina para wafer Semilab CMS3
fr Machine pour wafer Semilab CMS3
hr Stroj za oblatne Semilab CMS3
hu Semilab CMS3 Ostya gép
it Macchina per wafer Semilab CMS3
lt Vaflių mašina Semilab CMS3
nl Semilab CMS3 Wafelmachine
pl Maszyna do produkcji płytek półprzewodnikowych Semilab CMS3
pt Máquina de wafer Semilab CMS3
ro Aparat pentru napolitane Semilab CMS3
ru Semilab CMS3 Пластина
sr Mašina za vafle Semilab CMS3
sv Semilab CMS3 Wafer maskin
tr Wafer Makinası Semilab CMS3

Specifications

Software
-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status

Description

FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion.

The CLS models, CLS-1A, CLS-3A, and CLS-5A, Emitter Sheet Resistance Testers allow measurement of sheet resistance at 1 to 5 points with the high throughput that meets the requirements of in-line quality control in fully automated cell production lines.

The CMS models, CMS-1A, CMS-3A, Emitter Sheet Resistance Testers allow measurement of wafers i.e. conveyor belt does not stop during measurement. Therefore, they have the high throughput that meets the requirement of in-line quality control in fully automated cell production lines.

Featrues and System specifications:

Meas. technique: non-contact, junction photovoltage (JPV)
Sample size: 100 to 156 mm (210mm option)
Sample structure: np or pn junctions
Measurement range: 10 Î/sq. to 200 I/sq.
Probe distance: 1.5 mm probe height above transport bel
Wafer vertical position tolerance: < 400 μm
Sample support: on belt
Calibration: by wafers verified with four point probe
Options:

Measurement module (incl. 1A-5A sheet resistance measurement heads)
Industrial PC (Windows operation system) and peripherals
CLS-1M emitter checker option
Wafer presence sensor (CMS only)
Wide variety of available interfaces to automation and MES:

24V optically isolated I/O, Ethernet interface
Profibus
OPC DA
TCP/IP protocol, content can be XML or ASCII
SQL database
SECS/GEM

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


Client type Reseller
Active since 2019
Offers online 73
Last activity Nov. 21, 2024

Description

FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion.

The CLS models, CLS-1A, CLS-3A, and CLS-5A, Emitter Sheet Resistance Testers allow measurement of sheet resistance at 1 to 5 points with the high throughput that meets the requirements of in-line quality control in fully automated cell production lines.

The CMS models, CMS-1A, CMS-3A, Emitter Sheet Resistance Testers allow measurement of wafers i.e. conveyor belt does not stop during measurement. Therefore, they have the high throughput that meets the requirement of in-line quality control in fully automated cell production lines.

Featrues and System specifications:

Meas. technique: non-contact, junction photovoltage (JPV)
Sample size: 100 to 156 mm (210mm option)
Sample structure: np or pn junctions
Measurement range: 10 Î/sq. to 200 I/sq.
Probe distance: 1.5 mm probe height above transport bel
Wafer vertical position tolerance: < 400 μm
Sample support: on belt
Calibration: by wafers verified with four point probe
Options:

Measurement module (incl. 1A-5A sheet resistance measurement heads)
Industrial PC (Windows operation system) and peripherals
CLS-1M emitter checker option
Wafer presence sensor (CMS only)
Wide variety of available interfaces to automation and MES:

24V optically isolated I/O, Ethernet interface
Profibus
OPC DA
TCP/IP protocol, content can be XML or ASCII
SQL database
SECS/GEM

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase

Specifications

Software
-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status

About this seller

Client type Reseller
Active since 2019
Offers online 73
Last activity Nov. 21, 2024

Here is a selection of similar machines

See all alternatives

Loading similar machines...

Categories

Menu Categories search

Menu

Start selling

Semilab CMS3 Sheet Resistance Measuring System