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JEOL JSM 6460 Scanning Electron Microscope (SEM) with Oxford INCA Energy EDS system and MICS Microscope Image Capture System is a high-performance versatile SEM. The high-precision electron optical system incorporated in this SEM is effectively used with the large flexible specimen chamber that accommodates a 200mm diameter specimen. The easy-to-understand, easy-to-use operation GUI is developed for multi-user environment.
Magnification and Resolution photos will be provided. The system is 4 years old and was always under service contract until it was professional decommissioned by JEOL.
Magnification (X): 5 to 300000
Resolution (nm): 3.00
Accelerating Voltage (kilovolts): 0 to 30
Digital Display
Computer Interface
Optimized for fitting and integrating X-ray spectrometers
This equipment is located in US
Manufacturer | Jeol |
Model | JSM-6460 with O |
Year | 2004 |
Country | USA |
Condition | Good |
Main category | Lab, Medical and Bioscience |
Subcategory | Used Microscope |
ID | P40207285 |
Client type | Machinery dealer |
On Kitmondo since | 2011 |
Number of listings | 0 |
Country | USA |
Last activity | April 10, 2017 |