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FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL
Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion.
The CLS models, CLS-1A, CLS-3A, and CLS-5A, Emitter Sheet Resistance Testers allow measurement of sheet resistance at 1 to 5 points with the high throughput that meets the requirements of in-line quality control in fully automated cell production lines.
The CMS models, CMS-1A, CMS-3A, Emitter Sheet Resistance Testers allow measurement of wafers i.e. conveyor belt does not stop during measurement. Therefore, they have the high throughput that meets the requirement of in-line quality control in fully automated cell production lines.
Featrues and System specifications:
Meas. technique: non-contact, junction photovoltage (JPV)
Sample size: 100 to 156 mm (210mm option)
Sample structure: np or pn junctions
Measurement range: 10 Î/sq. to 200 I/sq.
Probe distance: 1.5 mm probe height above transport bel
Wafer vertical position tolerance: < 400 μm
Sample support: on belt
Calibration: by wafers verified with four point probe
Options:
Measurement module (incl. 1A-5A sheet resistance measurement heads)
Industrial PC (Windows operation system) and peripherals
CLS-1M emitter checker option
Wafer presence sensor (CMS only)
Wide variety of available interfaces to automation and MES:
24V optically isolated I/O, Ethernet interface
Profibus
OPC DA
TCP/IP protocol, content can be XML or ASCII
SQL database
SECS/GEM
This equipment is located in US
Manufacturer | Semilab |
Model | CMS3 |
Year | - |
Country | USA |
Condition | Good |
Main category | PCB and SMT equipment |
Subcategory | Wafer & Semi Test Equipment |
ID | P40312055 |
Client type | Machinery dealer |
On Kitmondo since | 2019 |
Number of listings | 50 |
Country | USA |
Last activity | March 14, 2024 |
Contact | Click here |